iie transactions

• Editor-in-Chief
  Elsayed A. Elsayed, Rutgers University, Piscataway, NJ, USA
  e-mail:

• Focused Issue Editor
  Elsayed A. Elsayed

• Departments and Editors
  1. Design of Experiments and Robust Designs
     Joseph J. Pignatiello, Jr., Texas A&M University, College Station, TX , USA
     e-mail:

  2. Book and Software Review
     John English, University of Arkansas, Fayetteville, AR, USA
     e-mail:

  3. Engineering Statistics and Applied Probability
     L. Albin, Rutgers University, Piscataway, NJ, USA
     e-mail:

  4. On-Line Quality Engineering
     Kailash Kapur, University of Washington, Seattle, WA, USA
     e-mail:

  5. Reliability Modeling and Optimization iie transactions
     Michael Tortorella, Lucent Technologies, Holmdel, NJ, USA
     e-mail:

  6. Feature Applications and Technology Transfer
     George Runger, Arizona State University, Tempe, AZ, USA
     e-mail:

• EDITORIAL BOARD MEMBERS

  N. Balakrishnan, Canada
  Amy Hancock Boyd, USA
  Jai-Hyun Byun, Korea
  Charles Champ, USA
  Argon Chen, Taiwan
  Tapas K. Das, USA
  Enrique Del Castillo, USA
  Luis A. Escobar, USA
  Nasser S. Fard, USA
  Joseph Foster, USA
  Richard J. Gerth, USA
  Russell G. Heikes, USA
  A. K. Jain, USA
  Andrew Jardine, Canada
  J. Bert Keats, USA
  Samuel Kotz, USA
  Lawrence Leemis, USA
  Ming Liang, Canada
  Saeed Maghsoodloo, USA
  Christina M. Mastrangelo, USA
  D.N.P. Murthy, Australia
  Joel Nachlas, USA
  O. Geoffrey, USA
  Shunji Osaki, Japan
  Hoang Pham, USA
  Jose Ribeiro, Brazil
  Robert Storer, USA
  Jen Tang, USA
  Marlin U. Thomas, USA
  W. A. Thompson, Jr., USA
  John Usher, USA
  Gary Wasserman, USA
  William H. Woodall, USA
  Min Xie, Singapore
  Ming Zuo, Hong Kong